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Supervised distance metric learning through maximization of the Jeffrey divergence
Artículo Académico
http://dx.doi.org/10.1016/j.patcog.2016.11.010
Overview
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Additional Document Info
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Overview
authors
Nguyen, Bac
MORELL, CARLOS ALEXIS
De Baets, Bernard
publication date
2017
published in
Pattern Recognition
Journal
Identity
Digital Object Identifier (DOI)
https://doi.org/10.1016/j.patcog.2016.11.010
Additional Document Info
number of pages
10
start page
215
end page
225
volume
64